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Semiconductor Test Consumables – The Road Ahead (Session 2)
An interactive webinar sponsored by SWTest, TestConX, and VLSI Research.

Join us for a special interactive webinar looking at the current and future semiconductor test consumables market! Register today as capacity is limited at this free one-of-a-kind event.

"Semiconductor Test Overview" – Jerry Broz
Jerry Broz will lead with an overview of the current and forecasted semiconductor device market including key industry statistics. His overview will include a review of the top wafer probe card suppliers.

"Test & Test Consumables Market Report" – Ira Feldman
In a holistic overview of high technology in light of the current COVID-19 pandemic, Ira Feldman will discuss the changing electronics market. He will also include a recap of the semiconductor test and burn-in socket markets including top suppliers.

"The Changing Cost Structure of Semiconductor Test" – John West
John West will conclude with an overview of how the emergence of System Level Test (SLT) in recent years is starting to have a real impact on the cost structure of semiconductor test.

Jun 24, 2020 05:00 PM in Pacific Time (US and Canada)

Webinar is over, you cannot register now. If you have any questions, please contact Webinar host: Rosina Mancia.