PHI's Virtual Fall Workshop Announcement
Join us to learn recent developments and explore applications in applied surface analysis. The three days will be filled with invited speakers, live Q&A, and other highlights from our customers and PHI lab scientists.
November 17, 18, 19
Workshop topics will include talks on sample preparation, application of XPS, AES and TOF-SIMS for fundamental and applied research, use of correlative surface analysis utilizing PHI USA instruments and advances in data collection and processing.
Invited speakers – our users from both academia and industry - include:
Fred Stevie, North Carolina State University, USA
Topic: Sample Handling, Preparation and Mounting for XPS and Other Surface Analytical Techniques
Alberto Herrera, CINVESTAV-Queretaro, Mexico
Topic: Three Issues Related to XPS Data Acquisition: Angular Aperture for ARXPS, "Magic" Angle, and Data Alignment
Bill Stickle, HP, USA
Topic: Surface Chemical Microanalysis
Anass Benayad, CEA, Liten, France
Topic: From Post-Mortem to Operando XPS, A New Approach for Lithium/Electrolyte Interface Study
Peng Li, University of Alberta, Canada
Topic: VersaProbe III - A Versatile Scanning XPS System for a Core-Facility
Nathaniel Rieders, Montana State University, USA
Topic: New Insights into Sulfide Inclusions in 1018 Carbon Steels.
Zhongrui Li, University of Michigan, USA
Topic: Oxidation State Effects on the Auger Transitions in 3D Transition-Metal Compounds
Robert Hamers, University of Wisconsin - Madison, USA
Topic: XPS and UPS Studies of Chemically Functionalized Diamond Surfaces
Sebastiaan Van Nuffel, Penn State University, USA
Topic: Biological ToF-SIMS
Anja Vanleenhove, IMEC, Belgium
Topic: Buried Interface and Buried Film Analysis Using Lab-Scale HAXPES Instrument
Derrick M. Poirier, 3M, USA
Topic: Using Post-it© Notes to Prevent LaB6 Deactivation
Full agenda coming soon.
Nov 17, 2020 10:00 AM
Time shows in
Nov 18, 2020 10:00 AM
Nov 19, 2020 10:00 AM