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PHI's Virtual Fall Workshop
PHI's Virtual Fall Workshop Announcement

Join us to learn recent developments and explore applications in applied surface analysis. The three days will be filled with invited speakers, live Q&A, and other highlights from our customers and PHI lab scientists.

November 17, 18, 19

Workshop topics will include talks on sample preparation, application of XPS, AES and TOF-SIMS for fundamental and applied research, use of correlative surface analysis utilizing PHI USA instruments and advances in data collection and processing.

Invited speakers – our users from both academia and industry - include:

Fred Stevie, North Carolina State University, USA
Topic: Sample Handling, Preparation and Mounting for XPS and Other Surface Analytical Techniques

Alberto Herrera, CINVESTAV-Queretaro, Mexico
Topic: Three Issues Related to XPS Data Acquisition: Angular Aperture for ARXPS, "Magic" Angle, and Data Alignment

Bill Stickle, HP, USA
Topic: Surface Chemical Microanalysis

Anass Benayad, CEA, Liten, France
Topic: From Post-Mortem to Operando XPS, A New Approach for Lithium/Electrolyte Interface Study

Peng Li, University of Alberta, Canada
Topic: VersaProbe III - A Versatile Scanning XPS System for a Core-Facility

Nathaniel Rieders, Montana State University, USA
Topic: New Insights into Sulfide Inclusions in 1018 Carbon Steels.

Zhongrui Li, University of Michigan, USA
Topic: Oxidation State Effects on the Auger Transitions in 3D Transition-Metal Compounds

Robert Hamers, University of Wisconsin - Madison, USA
Topic: XPS and UPS Studies of Chemically Functionalized Diamond Surfaces

Sebastiaan Van Nuffel, Penn State University, USA
Topic: Biological ToF-SIMS

Anja Vanleenhove, IMEC, Belgium
Topic: Buried Interface and Buried Film Analysis Using Lab-Scale HAXPES Instrument

Derrick M. Poirier, 3M, USA
Topic: Using Post-it© Notes to Prevent LaB6 Deactivation

Full agenda coming soon.
Nov 17, 2020 10:00 AM
Nov 18, 2020 10:00 AM
Nov 19, 2020 10:00 AM
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