Covalent Metrology proudly presents the 14th episode of our Covalent Academy webinar series, ‘Shining a Light on Optical Modeling for Spectral Ellipsometry,’ presented by Covalent’s own Dr. Max Junda (Senior Member of Technical Staff, Optical Characterization Lab).
Spectroscopic ellipsometry is a powerful and highly sensitive metrology technique. However, unlocking the full potential of ellipsometry requires more than collecting accurate data. Nearly all results are only obtained after fitting optical models to the original measurements; a sometimes-challenging process upon which the accuracy of the results varies. In this episode, we will discuss the many considerations and strategies that go into developing appropriate optical models for a variety of applications.
This webinar will:
1. Introduce optical modeling of spectroscopic ellipsometry data fundamentals: layered structures and optical properties
2. Describe common challenges and how to minimize and/or overcome them
3. Provide tips for designing experiments to improve model accuracy
4. Showcase various applications featuring a range of sample types and modeling strategies