In this webinar, our experts will discuss cutting-edge techniques and best practices for optimizing images captured with a FIB-SEM DualBeam microscope. Topics will include image interpretation, exploration of new state-of-the-art instrumentation, and the realm of analytical possibilities accessed using these techniques.
A DualBeam FIB-SEM combines a scanning electron microscope with a focused-ion-beam (FIB-SEM). With myriad detectors, the SEM produces nanometer-scale 2D images that interrogate different physical properties of the sample from topography to elemental composition to crystal structure. FIB imaging, while not as high-resolution as SEM imaging, offers another mode for extracting information from a sample. Additionally, the FIB allows for in situ sample alteration; it can be used to precisely cross-section, remove layers from, or mill arbitrary patterns into the sample. The FIB allows advanced analytical workflows such as: 3D slice-and view (tomography), subsurface cross-sectional characterization, and TEM lamella prep.
Application areas include metallurgy, semiconductors, nanomaterials, energy storage, medical devices, biotech, green energy, microelectronics and more.
Join the live event to learn more about:
1. Overview of FIB-SEM DualBeam systems
2. How to interpret images based on the contrast mechanisms, how to choose the contrast mechanism that highlights the phenomenon of interest, and how to set up the instrument to obtain that contrast mode
3. Troubleshooting methods for optimal microscope setup to obtain the desired images
4. Features, functions, and applications of instruments like the Thermo Scientific Scios & Helios 5