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ED-XRF for Film Thickness and Concentration Measurements with Rigaku
Join in to learn how micro-spot ED-XRF is used to analyze thin film properties and surface chemistry with micron-scale accuracy, and how the uniquely hybridized optical-microscopy and XRF sensor technologies of the Onyx deliver rapid, high-impact data with ease.

This talk, given by Brad Lawrence of Rigaku, will highlight the utility of micron-scale beam spot in ED-XRF and showcase example applications which demonstrate the Onyx’s specialized advantages for semiconductor and device manufacturing and processing.

THIS WEBINAR WILL ANSWER
- What is ED-XRF? How is it different than WD-XRF?
- How does ED-XRF quantify elemental composition?
- How can it be used to measure film thickness?
- What is the Onyx? Why does micron-scale spot-size matter?
Why use hybrid sensor technologies on an ED-XRF instrument?

Jul 23, 2020 11:00 AM in Pacific Time (US and Canada)

Webinar is over, you cannot register now. If you have any questions, please contact Webinar host: Shannon Scheiwiller.