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Effective test strategies for assembled boards
AOI, SPI, X-ray and end of line electrical test are constantly improving. This panel will discuss the latest innovations in test and how AI improves reliability and ultimately increases first-pass yield.

After the panel has been broadcast, it will be available within 24 hours at

Nov 9, 2021 03:30 PM in London

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Webinar is over, you cannot register now. If you have any questions, please contact Webinar host: Trevor Galbraith.